A method for components' damage detection based on optoelectronics imaging technology

doi:10.4028/www.scientific.net/AMM.513-517.4131

CQUET-IR

	A method for components' damage detection based on optoelectronics imaging technology
	WangJun
	2014
会议录名称	APPLIED SCIENCE, MATERIALS SCIENCE AND INFORMATION TECHNOLOGIES IN INDUSTRY
卷号	513-517
页码	4131-4134
会议名称	International Conference on Advances in Materials Science and Information Technologies in Industry (AMSITI)
会议日期	JAN 11-12, 2014
会议地点	Xian, PEOPLES R CHINA
出版地	STAFA-ZURICH
出版者	TRANS TECH PUBLICATIONS LTD
摘要	This paper puts forward a method for components' damage detection based on optoelectronics imaging technology. According to the collection principle of optoelectronics imaging system, using pixel gray scale difference approach, the method extracts pixel characteristics of the optoelectronics image, which is taken as data foundation of following damage detection. Edge pixel positioning method is adopted to calculate spatial location of optoelectronics data of the components' damaged area edge, thus enabling components damage detection. Experimental results show that the method can improve the accuracy of components optoelectronics damage detection and meets the needs of quality inspection in component production.
关键词	optoelectronics imaging edge pixels damage detection components
ISSN	1660-9336
DOI	10.4028/www.scientific.net/AMM.513-517.4131
收录类别	CPCI-S
语种	英语
WOS研究方向	Construction & Building Technology ; Engineering ; Mechanics
WOS类目	Construction & Building Technology ; Engineering, Civil ; Mechanics
WOS记录号	WOS:000349668905128
原始文献类型	Proceedings Paper
引用统计	被引频次[WOS]：0 [WOS记录] [WOS相关记录]
文献类型	会议论文
条目标识符	https://ir.cqcet.edu.cn/handle/39TD4454/4048
专题	重庆电子科技职业大学
作者单位	Chongqing Coll Elect Engn, Chongqing 401331, Peoples R China
推荐引用方式 GB/T 7714	WangJun. A method for components' damage detection based on optoelectronics imaging technology[C]. STAFA-ZURICH:TRANS TECH PUBLICATIONS LTD,2014:4131-4134.