Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process

doi:10.1109/ACCESS.2020.2965625

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	Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process
	Lu, Jing 1,2; Luo, Bin 1
	2020
发表期刊	IEEE Access
ISSN	2169-3536
卷号	8 页码:10686-10692
摘要	Due to the long life and high reliability of vertical cavity surface-emitting lasers, the performance degradation experiment cost is high, and the experiment cycle is long, because the degradation failure process of a semiconductor laser is a monotonic decreasing process, and the amount of performance degradation is independent for each function. Therefore, based on the Gamma process, the degradation performance of vertical cavity surface-emitting lasers has been modeled and analyzed in this paper. First, a model is given based on the Gamma process. Then, the failure distribution of the product is determined by analyzing the first arrival time distribution of the process, and then, the reliability of the product is statistically deduced to determine the residual life distribution of the device. Finally, combined with the data obtained from accelerated aging experiments, the product failure time of 261 470 hours is deduced, approximately 30 years. The model is in good agreement with the experimental results, which proves the validity of the model and provides a theoretical basis for the analysis of the reliability of the vertical cavity surface-emitting laser. According to the model, the reliability of the device decreases to 0.9994 after 100 000 hours of operation.
关键词	Vertical cavity surface emitting lasers reliability degradation
DOI	10.1109/ACCESS.2020.2965625
收录类别	SCIE
语种	英语
WOS研究方向	Computer Science ; Engineering ; Telecommunications
WOS类目	Computer Science, Information Systems ; Engineering, Electrical & Electronic ; Telecommunications
WOS记录号	WOS:000525406600002
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
原始文献类型	Article
出版地	PISCATAWAY
引用统计	被引频次[WOS]：0 [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	https://ir.cqcet.edu.cn/handle/39TD4454/3570
专题	重庆电子科技职业大学
作者单位	1.Southwest Jiaotong Univ, Sch Informat Sci & Technol, Chengdu 610031, Peoples R China; 2.Chongqing Coll Elect Engn, Coll Elect & Internet Thing, Chongqing 400030, Peoples R China
推荐引用方式 GB/T 7714	Lu, Jing,Luo, Bin. Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process[J]. IEEE Access,2020,8:10686-10692.
APA	Lu, Jing,&Luo, Bin.(2020).Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process.IEEE Access,8,10686-10692.
MLA	Lu, Jing,et al."Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process".IEEE Access 8(2020):10686-10692.

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