Auto-detect of machine vision and its application in assembling inspection

doi:10.1109/WCICA.2011.5970537

	Auto-detect of machine vision and its application in assembling inspection
	Wang, Jing1 ; Yang, Xiaoyi 2
	2011
会议录名称	Proceedings of the World Congress on Intelligent Control and Automation (WCICA)
页码	18-22
出版者	Institute of Electrical and Electronics Engineers Inc.
摘要	Aimed at the inspection of non-defect work-piece, the paper proposed a sort of image processing method to make scathe-less detect for work-piece by industrial CT. Based on the auto-detect of image edge by image segment algorithm extracted geometry size of CT image, firstly non-defect work-piece was chose out to implement accurate location of CT image for the same work-piece section by phase correlation method, then the location of possible template image in the waited detect image could be judged by modified Hausdorff distance. In this paper, it took the recognition inspection of precision assembly of metal parts as an example that judged the location information in the original image by means of template image. The judged results viewed that the correct recognition rate was 100 for part assembly being right and whether leak assembly. The instance inspection results show that it is high in precision and repetitiveness. © 2011 IEEE.
关键词	Computer vision Correlation methods Defects Edge detection Image segmentation Inspection Location Accurate location CT Image Image processing methods Location information Modified Hausdorff Distance objection recognition Phase correlation method Precision assemblies
DOI	10.1109/WCICA.2011.5970537
收录类别	EI
语种	英语
EI入藏号	20113614312005
原始文献类型	Conference article (CA)
文献类型	会议论文
条目标识符	https://ir.cqcet.edu.cn/handle/39TD4454/3276
专题	人工智能与大数据学院
作者单位	1.Dept. of Computer Application, Chongqing College of Electronic Engineering, Chongqing 401331, China; 2.College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China
第一作者单位	重庆电子科技职业大学
推荐引用方式 GB/T 7714	Wang, Jing,Yang, Xiaoyi. Auto-detect of machine vision and its application in assembling inspection[C]:Institute of Electrical and Electronics Engineers Inc.,2011:18-22.

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